Toshiba Standardizes on CCS Technology at 65nm to Improve Accuracy and Designer Productivity
Unified Power Format, Open Analog Standards and Liberty Library Enhancements to be Featured at 19th EDA Interoperability Forum
Synopsys Boosts Designer Productivity by Launching Liberty NCX Characterization Solution
Virage Logic Adds Liberty Composite Current Source Model Support to Memory and Logic IP
TSMC and Synopsys Announce CCS Model Support for TSMC'S 65-Nanometer Process
EE Times
Synopsys boosts CCS with library tools
EDA DesignLine
Test Methods Identify Small Delay Defects
Test and Measurement World
ITC: Synopsys addresses yield, memory test, and small delay defects
EE Times Asia
Flexible Analysis is Key to Power Integrity
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